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【英文标准名称】:StandardTestMethodforSeparatinganIonizingRadiation-InducedMOSFETThresholdVoltageShiftIntoComponentsDuetoOxideTrappedHolesandInterfaceStatesUsingtheSubthresholdCurrent-VoltageCharacteristics
【原文标准名称】:利用亚阈值安伏特性分离由于氧化空穴和界面态产生的电离辐射感应金属氧化物半导体场效应晶体管阈电压偏移的标准试验方法
【标准号】:ASTMF996-2010
【标准状态】:现行
【国别】:美国
【发布日期】:2010
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:F01.11
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:
【英文主题词】:c/vcharacteristics;current&x2013;voltagecharacteristics;interfacestates;ionizingradiation;MOSFET;oxide-trappedholes;thresholdvoltageshift;trappedholes;Currentmeasurement--semiconductors;Electricalconductors
【摘要】:Theelectricalpropertiesofgateandfieldoxidesarealteredbyionizingradiation.ThemethodfordeterminingthedosedeliveredbythesourceirradiationisdiscussedinPracticesE666,E668,E1249,andGuideE1894.Thetimedependentanddoserateeffectsoftheionizingradiationcanbedeterminedbycomparingpre-andpost-irradiationvoltageshifts,x0394;Votandx0394;Vit.ThistestmethodprovidesameansforevaluationoftheionizingradiationresponseofMOSFETsandisolationparasiticMOSFETs.Themeasuredvoltageshifts,x0394;Votandx0394;Vit,canprovideameasureoftheeffectivenessofprocessingvariationsontheionizingradiationresponse.Thistechniquecanbeusedtomonitorthetotal-doseresponseofaprocesstechnology.1.1Thistestmethodcoverstheuseofthesubthresholdchargeseparationtechniqueforanalysisofionizingradiationdegradationofagatedielectricinametal-oxide-semiconductor-field-effecttransistor(MOSFET)andanisolationdielectricinaparasiticMOSFET.,,Thesubthresholdtechniqueisusedtoseparatetheionizingradiation-inducedinversionvoltageshift,x0394;VINVintovoltageshiftsduetooxidetrappedcharge,x0394;Votandinterfacetraps,x0394;Vit.Thistechniqueusesthepre-andpost-irradiationdraintosourcecurrentversusgatevoltagecharacteristicsintheMOSFETsubthresholdregion.1.2ProceduresaregivenformeasuringtheMOSFETsubthresholdcurrent-voltagecharacteristicsandforthecalculationofresults.1.3TheapplicationofthistestmethodrequirestheMOSFETtohaveasubstrate(body)contact.1.4Bothpre-andpost-irradiationMOSFETsubthresholdsourceordraincurvesmustfollowanexponentialdependenceongatevoltageforaminimumoftwodecadesofcurrent.1.5ThevaluesstatedinSIunitsaretoberegardedasstandard.Nootherunitsofmeasurementareincludedinthisstandard.1.6Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:L42
【国际标准分类号】:
【页数】:7P.;A4
【正文语种】:英语


【英文标准名称】:Aerospaceseries-Cables,electrical,aircraftuse;Testmethods-Part406:Coldbendtest;GermanversionEN3475-406:2002
【原文标准名称】:航空航天系列.航空用电缆.试验方法.第406部分:冷弯曲试验;德文版本EN3475-406:2002
【标准号】:EN3475-406-2002
【标准状态】:现行
【国别】:
【发布日期】:2002-08
【实施或试行日期】:
【发布单位】:欧洲标准学会(EN)
【起草单位】:
【标准类型】:()
【标准水平】:()
【中文主题词】:弯曲试验;弯曲性能;冷式法;低温试验;卷绕试验;缠绕试验;络纱;试验;规范(验收);电缆;电缆;多语种的;导电体;电的;飞行器;电线;航空航天运输;航空运输
【英文主题词】:Aerospacetransport;Airtransport;Aircraft;Bendtesting;Bendingbehaviour;Cables;Coldtests;Coldness;Electriccables;Electricconductors;Electrical;Electricalcords;Multilingual;Specification(approval);Testing;Winding;Windingtests;Wrappingtests
【摘要】:
【中国标准分类号】:V25
【国际标准分类号】:49_060
【页数】:7P.;A4
【正文语种】:英语